Guest lecture at the FHNW: metrology in the product development degree programme

Last Friday I had the pleasure of speaking as a guest lecturer at the FHNW in Windisch to around 40 students of the product development degree programme.

An engaging afternoon on industrial metrology – from tactile and optical measurement through structured light projection, contour and roughness measurement to industrial computed tomography.

Together we discussed what precision really means, how accuracy and measurement uncertainty differ, and how the conformity decision has to be applied correctly from the point of view of both supplier and customer.

After that we turned to specification per ISO GPS. Specific questions could be asked and first approaches to real challenges from practice developed on the spot – exactly the kind of exchange I value most.

Another topic was reverse engineering, where we showed how scan, CAD and measurement data are linked and how geometries conforming to the standards can be derived from them again.

Many thanks to the FHNW for the invitation and to the students for their interest – sharing enthusiasm for metrology was a great pleasure.